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(Ti-Co-Mo-Ta-W)N Exploration
Ag-Ir-Pd-Pt-Ru
Li-Al-O
Mg-Mn-Al-O
Nb-Mo-Ta-W
Sputter-deposited La-Co-Mn-O nanocolumns for OER
Active Learning Resistance
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Li-Al-O
Li-Al-O
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3 Li-Al-O library
Sample
Li-Al-O thin film materials library, fabricated by inert co-sputtering of Li and Al, and post-deposition annealing in O2 atmosphere.
D-NRA - RBS result
Raw Document
D-NRA - RBS result.xlsx
XPS depth profile (300°C, 3 h)
XPS Raw
XPS depth profile (300°C, 3 h).vms
XRD mapping, baseline subtracted (300°C, 3 h)
XRD CSV (342 columns)
show table
XRD mapping, baseline subtracted (300°C, 3 h).csv
XRD(T)
XRD CSV (342 columns)
show table
XRD(T).CSV
XPS depth profile (350°C, 3 h)
XPS Raw
XPS depth profile (350°C, 3 h).vms
XPS depth profile (450°C, 3 h)
XPS Raw
XPS depth profile (450°C, 3 h).vms
XPS depth profile (450°C, 5 h) 1
XPS Raw
XPS depth profile (450°C, 5 h) 1.vms
XPS depth profile (450°C, 5 h) 2
XPS Raw
XPS depth profile (450°C, 5 h) 2.vms
XPS depth profile (450°C, 7 h) 1
XPS Raw
XPS depth profile (450°C, 7 h) 1.vms
XPS depth profile (450°C, 7 h) 2
XPS Raw
XPS depth profile (450°C, 7 h) 2.vms
XPS depth profile (550°C, 3 h)
XPS Raw
XPS depth profile (550°C, 3 h).vms
XPS depth profile (550°C, 7 h)
XPS Raw
XPS depth profile (550°C, 7 h).vms
XPS depth profile (650°C, 3 h)
XPS Raw
XPS depth profile (650°C, 3 h).vms
XPS depth profile (750°C, 10 min)
XPS Raw
XPS depth profile (750°C, 10 min).vms
XPS depth profile (850°C, 2 min)
XPS Raw
XPS depth profile (850°C, 2 min).vms
XPS mapping (300°C, 3 h)
XPS Raw
XPS mapping (300°C, 3 h).vms
XPS mapping peak fitting (300°C, 3 h)
XPS Raw
XPS mapping peak fitting (300°C, 3 h).xlsx